Probe Test manipulators are designed for use with a specific ATE test head and wafer prober combination. If floor space, ceiling height, or peripheral equipment pose a challenge on your test floor, one of our Probe Test manipulators will fulfill your unique prober dedicated test requirements.

Our PDT style manipulator provides similar functionality to a Universal manipulator while considerably reducing the test cell footprint. The HK manipulator is an evolution of the PDT design with unique features to further reduce footprint, accommodate lower ceiling heights, and support the heaviest test heads on the market today. Our hinge (PS) style manipulator incorporates a true independent vertical (Z) motion to allow the test head to properly engage and disengage from any probe interface hardware before utilizing the hinge over motion.