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Electrical Interface

Product Family

DIB Locker

∙ Direct Dock probe interface
∙ Custom Solutions Available

Chameleon

∙ Ideal solution for open architecture testers.
∙ 11” Probe Card Support
∙ 7” of Application Space
∙ Up to 5,056 Total Pins / 32 Modules
∙ Interchangeable Modules Available: Standard 5-Wire Array, Coax, RF, High Current, & Force

RA1280

∙ Standard Electrical Platform
∙ Supports Multiple Probe Card Sizes
∙ 7.5”, 9.25”, & 11” Rings
∙ 1,280 Pins per Ring
∙ Up to 256 high-speed coaxial lines per Ring
∙ Supports RF (up to 16 Lines per Ring), Mixed Signal, & S.O.C. Platforms

Apollo

∙ Supports NI STS Standard
∙ 12” Probe Card fits into existing J750 compatible probers
∙ Over 9” of Application Space
∙ Up to 4,384 Total Pins / 32 Modules
∙ Optional RF Ring (64 or 128 port) with DX/CX Mounting Adapte

Taro

∙ Advantest V93000 & T2000 Coax Array Pattern & Stack Height Compatible
∙ Legacy HP 93K Probe Cards Compatible
∙ Up to 1,024 I/O & 512 Utility Pins

Vulcan

∙ J750 EX Pattern & Stack Height Compatible
∙ 12” Probe Card Support
∙ 8” of Application Space
∙ Up to 5,848 Total Pins

Gatlin

∙ Eagle ETS Compatible
∙ Up to 24 Impedance-Controlled Modules (158 pins max per)
∙ Optional 32 port SMP RF Ring

Matrix

∙ Minimal Required Docking Force
∙ 440mm Probe Card Support
∙ 8,120 Max Pin Count (203 per Module)
∙ Maximum Amount of Application Space
∙ Stiffeners Available

Hornet

∙ J750 Pattern & Stack Height Compatible
∙ 12” Probe Card Support
∙ Available Configurations:
512 I/O (1,496 Pins) + 408 Utilities
512 + Utilities (1,904 Pins) + 816 Utilities
1,024 I/O (2,992 Pins) + 816 Utilities

Firefox 440

∙ 440mm Probe Card Support
∙ 6.7 in² of Application Space
∙ Up to 7,920 Total pins / 20 Modules
∙ Stiffeners Available

D-10

∙ OEM Standard
∙ Up to 21 Modules (137 pins max per)
∙ 2,877 Max Pin Count
∙ Regular & High Density Configurations
∙ Hand Test Kit Available

T-Flex

∙ Teradyne Flex Pattern & Stack Height Compatible
∙ Standard Pin Configurations: 900, 1,080, 1,350, 1,620, & 2,070
∙ 5-Wire Array Pattern

T-Flex 440

∙ OEM Stack Height Standard
∙ 440mm Probe Card Support
∙ Up to 2,880 Total Pins

Reid-Ashman’s electrical interface solutions set the standard for flexibility with modular designs that can easily adapt to numerous test configurations. Our spring probe towers are based on a flexible design concept that allows them to be reconfigured, expanded, and upgraded to meet all of your changing test requirements. For testers requiring high or low pin counts, analog, digital, RF or high current applications, there is a modular configuration to fit your needs. Reid-Ashman’s spring probe towers can be used with our StingRay clamshell mechanical test interface platform to allow for different spring probe tower, probe card, and tray combinations.

Common Features:

  • Modular Design
  • True Vertical Spring Pin Engagement
  • Uniform Spring Contact Force
  • Distortion Free Signal
  • Consistent & Accurate Test Data
  • Short Manufacture Lead Time
  • Custom Engineering Available

Reliable

Reid-Ashman Electrical Interfacing products are designed to meet the performance and operational challenges of today’s complex tester/probe card interface applications. Reid-Ashman Electrical Interfacing systems ensure accurate, distortion free signal transmission with any tester/prober combination.

Efficient

Reid-Ashman Electrical Interfacing utilizes a modular design with multiple, distinct setup configurations. This provides for an upgradable and expandable product regardless of changing test requirements.

Productive

Reid-Ashman Electrical Interfacing is designed to increase production. Minimal maintenance, distortion free signal transmission, and multiple tower configurations ensure a long-term value and outstanding productivity.
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